Non-volatile multi-threshold cmos latch with leakage control

H - Electricity – 03 – K

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Details

H03K 3/356 (2006.01) H01L 27/092 (2006.01) H03K 3/037 (2006.01)

Patent

CA 2487363

An integrated circuit including a Multi-Threshold CMOS (MTCMOS) latch combining low voltage threshold CMOS circuits with high voltage threshold CMOS circuits. The low voltage threshold circuits including a majority of the circuits in the signal path of the latch to ensure high performance of the latch. The latch further including high voltage circuits to eliminate leakage paths from the low voltage threshold circuits when the latch is in a sleep mode. A single-phase latch and a two-phase latch are provided. Each of the latches is implemented with master and slave registers. Data is held in either the master register or the slave register depending on the phase or phases of the clock signals. A multiplexer may alternatively be implemented prior to the master latch for controlling an input signal path during sleep and active modes of the latch and for providing a second input signal path for test.

L'invention concerne un circuit intégré comprenant un verrou CMOS à seuils multiples (MTCMOS) combinant des circuits CMOS à seuil basse tension et des circuits CMOS à seuil haute tension. Les circuits à seuil basse tension constituent la majorité des circuits dans le trajet du signal du verrou afin d'assurer une performance élevée du verrou. Le verrou comprend, en outre, des circuits haute tension destinés à éliminer des trajets de fuite des circuits à seuil basse tension lorsque le verrou est en mode de veille. L'invention concerne aussi un verrou à phase unique et un verrou à phase double. Chacun des verrous est mis en oeuvre avec des registres maître et esclave. Les données sont maintenues soit dans le registre maître soit dans le registre esclave en fonction de la phase ou des phases des signaux de synchronisation. Dans un mode de réalisation il est possible de mettre en oeuvre un multiplexeur avant le verrou maître de façon à commander un trajet de signal d'entrée lors des modes de veille et d'activité du verrou et à fournir un second trajet de signal d'entrée aux fins de tests.

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