Nondestructive inspection method and system

Details Nondestructive inspection method and system Nondestructive inspection method and system

G - Physics

01

N

G01N 23/04 (2006.01) G01N 29/06 (2006.01) G01R 33/56 (2006.01) G01M 15/14 (2006.01)

Patent

CA 2693468

A method and system for nondestructively detecting and quantifying material anomalies within materials, including composite articles. The method entails performing a three-dimensional imaging scan technique, such as a computed tomography scan, of the material and a reference standard such that a test image of the material and a reference image of the reference standard appear in a plurality of two--dimensional scan views generated by the scan technique. The reference images are located in the scan views and normalized to determine at least an average value of the pixel data for the reference images. Values of pixel data of the test image are determined in each scan view, and then compared to the pixel data of the reference images to detect the presence of an anomaly in the test images. The detected anomaly in at least one of the test images of the scan views is then compared to a requirement standard for the material.

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