Nonlinear vibrational microscopy

G - Physics – 01 – J

Patent

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G01J 3/44 (2006.01) G01N 21/65 (2006.01)

Patent

CA 2338291

The present invention is a method and apparatus for microscopic vibrational imaging using coherent Anti-Stokes Raman Scattering or Sum Frequency Generation. The spatial resolution is attained by minimizing the spot size of the optical interrogation beams on the sample. Minimizing the spot size relies upon a) directing at least two substantially co-axial laser beams (interrogation beams) through a microscope objective providing a focal spot on the sample; b) collecting a signal beam together with a residual beam from the at least two co-axial laser beams after passing through the sample; c) removing the residual beam; and d) detecting the signal beam thereby creating said pixel. The method has significantly higher spatial resolution than IR microscopy and higher sensitivity than spontaneous Raman microscopy with much lower average excitation powers.

L'invention concerne un procédé et un appareil destinés à l'imagerie microscopique vibratoire utilisant la diffusion Raman anti-Stokes ou la génération de la fréquence somme. On atteint la résolution spatiale par la diminution de la taille du spot des faisceaux optiques d'interrogation sur l'échantillon. On diminue la taille du spot de la manière suivante: a) en dirigeant au moins deux faisceaux laser sensiblement coaxiaux (des faisceaux d'interrogation) à travers un objectif de microscope qui crée un spot focal sur l'échantillon; b) en collectant un faisceau de signaux avec un faisceau résiduel provenant d'au moins deux faisceaux laser sensiblement coaxiaux, une fois le passage à travers l'échantillon achevé; c) en enlevant le faisceau résiduel et; d) en détectant le faisceau de signaux et en créant ainsi ledit pixel. Le procédé possède une résolution spatiale sensiblement plus élevée que les microscopes infrarouges et une sensibilité plus élevée que les microscopes Raman spontanés, et ce avec des puissances moyennes d'excitation beaucoup moins importantes.

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