G - Physics – 01 – J
Patent
G - Physics
01
J
G01J 1/00 (2006.01) A61B 3/103 (2006.01) A61F 9/01 (2006.01) A61F 9/008 (2006.01)
Patent
CA 2311818
A system and method for objective measurement and correction of focusing optical systems comprising optics disposed in the path of the beam (18) which directs the beam through the focusing optical system, e.g., and eye (120) and focuses the beam at its rear portion (122). The beam is diffusely reflected back and a wavefront analyzer (26) is disposed in the path of the wavefront projected from the optics and calculates the distortions as an estimate of aberrations of the focusing optical system.
L'invention concerne un système et un procédé permettant la mesure et la correction objective des systèmes optiques de focalisation, moyennant la présence dans le trajet du faisceau (18) d'un dispositif optique dirigeant le faisceau à travers ces systèmes, par exemple, et à travers l'oeil (120), et focalisant le faisceau dans sa partie arrière (122). Il s'ensuit pour le faisceau une réflexion diffuse et, par ailleurs, un analyseur de front d'onde (26) placé sur le trajet du front d'onde émanant de l'optique permet de calculer les distortions, à titre d'estimation relative aux aberrations de tel ou tel système optique de focalisation.
Burkhalter James H.
Campin John A.
Frey Rudolph W.
Poppeliers Edward
Zepkin Neil
Autonomous Technologies Corporation
Macrae & Co.
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