G - Physics – 01 – N
Patent
G - Physics
01
N
73/55
G01N 21/47 (2006.01) G01J 3/12 (2006.01) G01N 21/35 (2006.01) G01N 21/59 (2006.01) G01J 1/44 (2006.01) G01J 4/00 (2006.01)
Patent
CA 1311367
ABSTRACT OF THE DISCLOSURE OPTICAL ANALYSIS METHOD AND APPARATUS HAVING PROGRAMMABLE RAPID RANDOM WAVELENGTH ACCESS The optical reflectance or transmittance concentration analyzer includes an acousto-optical tunable filter (AOTF) with a pair of crossed polarizers to select one of the tuned monochromatic light beams that pass from a light source through the AOTF. The AOTF is tuned by a computer controlled digital-to-analog converter through a tunable sweep oscillator. To obtain rapid wavelength change along with electronic chopping or wavelength modulation, the digital-to-analog converter output is added to the output of a high speed signal generator. The modulated light is conducted directly or through a fiber optic cable to the location of the optical measurement and impinges upon the sample where it is reflected or transmitted. The emerging light is collected onto detector (8). The measurement time interval can be distributed among the required wavelengths or wavelength pairs according to an unequal scheme to decrease the error of the result in a calibration equation. The apparatus is particularly adaptable for use as an on-line concentration monitor in industrial process control because of its stability, efficiency and ability to perform quick analyses.
535660
Kemeny Gabor J.
Wetzel David L.
Bran+luebbe Gmbh
Gowling Lafleur Henderson Llp
Kemeny Gabor J.
Wetzel David L.
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