Optical detector for echelle spectrometers

Details Optical detector for echelle spectrometers Optical detector for echelle spectrometers

G - Physics

01

J

G01J 3/36 (2006.01) G01J 3/02 (2006.01) G01J 3/24 (2006.01) G01J 3/28 (2006.01)

Patent

CA 2178247

A solid-state detector for use in an atomic spectrometer comprises a plurality of arrays of sensing elements, or pixels, each of the arrays being positioned along and on the locations of spectral signals on a focal plane of an echelle grating spectrometer. The sensing elements are positioned along the many diffraction orders presented on a two- dimensional echelle grating focal plane so that at least one element is located at each and every resolution element regardless of global x-y coordinate positioning of the elements or with reference to each other. The result is a series of skewed lines of sensing elements, those lines being in the same shape as the series of diffraction order lines which comprise an echelle spectrum. The solid-state detector is particularly useful in an atomic spectrometer wherein an echelle grating is used to diffract incident radiation such that the various components of the radiation may be observed.

Affiliated with

Also associated with

Rating

Optical detector for echelle spectrometers does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Optical detector for echelle spectrometers, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Optical detector for echelle spectrometers will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFCA-PAI-O-1609744