Optical device inspection system and method using a large...

Details Optical device inspection system and method using a large... Optical device inspection system and method using a large...

G - Physics

01

M

G01M 11/00 (2006.01)

Patent

CA 2542338

An optical device inspection system and method employing a narrow aperture on a magnifying objective lens in order to reduce the circle of confusion and increase the depth of field. The smaller aperture resulting in an increase in depth of field allows for simultaneous focus for all portions of objects being inspected. An arc lamp with an elliptical reflector in combination with a condenser lens focuses a more intense beam of light through the objective lens, thereby providing sufficient brightness without sacrificing any depth of field.

L'invention concerne un système de contrôle d'un dispositif optique et un procédé utilisant une ouverture étroite ménagée sur un objectif grossissant pour réduire le cercle de confusion et accentuer la profondeur de champ. L'ouverture plus petite résultant de l'accentuation de la profondeur de champ permet d'effectuer une mise au point simultanée pour toutes les parties d'objets soumises au contrôle. Une lampe à arc comprenant un réflecteur elliptique combiné à une lentille de champ collectif focalise un faisceau lumineux plus intense à travers l'objectif apportant ainsi une luminosité suffisante sans rien perdre de la profondeur de champ.

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