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Patent
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R
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G01R 29/08 (2006.01) G01R 29/12 (2006.01) G02F 1/03 (2006.01)
Patent
CA 1211155
ABSTRACT OF THE DISCLOSURE An apparatus for measuring electric field by making use of electrooptic effect includes an electrooptical crystal having a crystallographically eulytite structure such as Bi4Ge3O12, Bi4Si3O12 or Bi4(Ge, Si)3O12 as a material with electrooptic effect. The optical electric- field measuring apparatus has an increased measuring sensitivity and a stabilized temperature characteristic and scarcely disturbs the distribution of electric field to be measured.
446862
Matsumura Hiroyoshi
Nagatsuma Kazuyuki
Takagi Kazumasa
Hitachi Ltd.
Hitachi Cable Ltd.
Kirby Eades Gale Baker
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