Optical interrogation system for use in constructing flat...

Details Optical interrogation system for use in constructing flat... Optical interrogation system for use in constructing flat...

H - Electricity

01

J

H01J 9/00 (2006.01) H01J 9/18 (2006.01) H01J 9/42 (2006.01)

Patent

CA 2077727

An optical interrogation system has camera arrays useful for determining the locations of a plurality of apertures on a flat tension shadow mask and fiducial marks on a screened front panel of a CRT. The system determines the actual location of apertures or fiducial marks with respect to the cameras field of view. By eliminating gray scaling, and processing only for light/dark transitions in single-bit binary valued pixels from each of the cameras in parallel, i.e., simultaneously, remarkable rapidity is obtained in the interrogation of widely spaced fields with mini- mal hardware. The system may also be used to interrogate mask support surfaces on the front panel prior to welding the mask thereto.

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