Optical measuring method and optical measuring arrangement...

Details Optical measuring method and optical measuring arrangement... Optical measuring method and optical measuring arrangement...

G - Physics

01

D

G01D 5/26 (2006.01) G01R 15/24 (2006.01) G01R 33/032 (2006.01)

Patent

CA 2240523

Polarized measuring light propagates through a sensor device and is then split into two differently linearly polarized partial light signals. An intensity-normalized measuring signal is derived from the two partial light signals and their direct components.

Une lumière de mesure polarisée (L) passe à travers un capteur (3) et est ensuite divisée en deux signaux lumineux partiels (L1, L2) à polarisation linéaire différenciée. Un signal de mesure (M), dont l'intensité a été mise à l'échelle, est dérivé des deux signaux lumineux partiels (L1, L2) et de leur composantes continues.

Affiliated with

Also associated with

Rating

Optical measuring method and optical measuring arrangement... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Optical measuring method and optical measuring arrangement..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Optical measuring method and optical measuring arrangement... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFCA-PAI-O-1788489