Optical profile measuring apparatus

Details Optical profile measuring apparatus Optical profile measuring apparatus

G - Physics

01

B

33/32

G01B 11/24 (2006.01) G01B 11/08 (2006.01)

Patent

CA 1311117

22bcw LGL/C 4533.1 Abstract of the Disclosure An apparatus for measuring the profile of portions of an article located within a predefined plane. Each portion is scanned, such as by an optical micrometer provid- ing a beam of radiant energy, to determine its dimension. The distance between each portion and a vertical reference is also scanned to determine its dimension. The article is rotated about an axis intersecting the predefined plane with- in the scan of the beam and is axially moved along an axis parallel to the intersecting axis within the scan of the beam so that the dimension of each portion and its distance from the vertical reference can be determined. The apparatus may be used in combination with a cavity identification system to control manufacturing employing multiple molds.

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