Optical scheme for high flux low-background two-dimensional...

Details Optical scheme for high flux low-background two-dimensional... Optical scheme for high flux low-background two-dimensional...

G - Physics

01

N

G01N 23/201 (2006.01) G01N 23/20 (2006.01) H05G 1/52 (2006.01)

Patent

CA 2395293

An x-ray analysis system including a focusing optic for focusing an x-ray beam to a focal point, a first slit optically coupled to the focusing optic, a second slit optically coupled to the first slit, and an x-ray detector, where the focal point is located in front of the detector.

L'invention concerne un système d'analyse aux rayons X qui inclut une optique de focalisation pour focaliser un faisceau de rayons X sur un foyer, une première fente couplée optiquement à l'optique de focalisation, une deuxième fente couplée optiquement à la première fente, et un détecteur aux rayons X à l'avant duquel est situé le foyer.

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