Optical system for measuring dimensions of objects

G - Physics – 01 – B

Patent

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33/32, 340/136.3

G01B 11/02 (2006.01) G01B 11/06 (2006.01) G01B 11/22 (2006.01) G01B 11/25 (2006.01)

Patent

CA 1088302

ABSTRACT OF THE DISCLOSURE A microscope-projector system is employed to image and view a transistion of light and dark on an object. The position of the shadow corresponds to the vertical position of a portion of the object, and an adjustable device is employed for adjusting the position of the microscope- projector with respect to the object. A video camera may be connected to the microscope, to project the image on a monitor. Vertical adjustment of the microscope-projector assembly enables measurement of thickness, for example, with respect ot a reference level. The scan lines of the video camera may also be employed to locate the position of the shadow to indicate the thick- ness of the object, and also to automatically readjust the position of the shadow to reference level. Electronic circuitry may also play a part to determine from transition in scan lines the horizontal dimensions of an object.

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