Optical system including etalon

Details Optical system including etalon Optical system including etalon

G - Physics

02

F

345/11

G02F 1/35 (2006.01)

Patent

CA 1285639

OPTICAL SYSTEM Abstract An optical system is disclosed which includes at least a first source of electromagnetic radiation (signal beam radiation), a device for processing the signal beam radiation, and a detector for detecting the processed signal beam radiation. The processing device functions, for example, as an amplitude modulator, a demultiplexer, or a switch, and includes a material region exhibiting a nonlinear optical response at one or more resonant wavelengths of electromagnetic radiation, as well as at least a second source. of electromagnetic radiation (control beam radiation) for selectively inducing the nonlinear optical response. Significantly, the wavelength, duration and intensity of the control beam radiation are chosen to induce a resonant, nonlinear optical response, essentially free of any relatively slow component, in said material region at repetition rates higher than about 2.5 x 104 Hz, or higher than about 3.3 x 1010 Hz, or even as high, or higher, than about 2.5 x 1011 Hz.

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