Optical time domain reflectometry measurements on a...

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G01M 11/02 (2006.01) G01M 11/00 (2006.01)

Patent

CA 2107454

-7- OPTICAL TIME DOMAIN REFLECTOMETRY MEASUREMENTS ON A MULTI-BRANCH OPTICAL NETWORK Abstract Detecting and evaluating optical subcircuits created by optical splitters in an optical circuit. One or more optical wavelengths are utilized for the transmission of data; whereas, other optical wavelengths are utilized to performoptical time domain reflectometry measurements on each optical subcircuit. Following an optical splitter, each optical path from the optical splitter has inserted into it an optical filter which allows the transmission of the optical wavelengths utilized for data transmission and one of the optical wavelengths utilized to perform the optical time domain reflectometry measurements. An optical time domain reflectometry instrument transmits each of the optical wavelengths, utilized fortesting, individually into the optical circuit and analyzes the returned optical pulse. Since only one optical subcircuit allows the passage of any given optical wavelength for testing, each optical subcircuit can be fully analyzed.

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