Panel surface flaw inspection

Details Panel surface flaw inspection Panel surface flaw inspection

G - Physics

01

N

73/58, 340/124.5

G01N 21/55 (2006.01) G01F 1/66 (2006.01) G01M 3/38 (2006.01) G01N 21/41 (2006.01) G01N 21/88 (2006.01) G01N 21/89 (2006.01)

Patent

CA 1273224

Abstract of the Disclosure Apparatuses and methods are disclosed for inspecting surfaces for defects. Light is used to illuminate the surface, which light is then reflected from a retro-reflective screen and re-reflected from the surface. This light is then imaged to determine the presence of defects of the surface. Semi and fully automatic techniques for quantifying and locating localized surface distortions are used.

504048

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