Partial-scan built-in self-testing circuit having improved...

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G01R 31/28 (2006.01) G01R 31/3183 (2006.01) G01R 31/3185 (2006.01)

Patent

CA 2119226

-19- The testability of a near-acyclic circuit (14) can be enhanced by the addition of one or more control points (36) and observation points (34) to allow for increased observability and controllability of selected nodes (28). The control points (36) and/or test points (34) are added by first computing the controllability, observability and fault detection probability at each node. A fault is then selected. If either the controllability or observability for such fault is not inside a prescribed value range, and the fault detection probability is below a prescribed value, then either a control point (36) and/or an observation point (34) may be added.

On peut améliorer la testabilité d'un circuit quasi-acyclique (14) par l'addition d'un ou de plusieurs points de contrôle (36) et d'un ou de plusieurs points d'observation (34) pour accroître l'observabilité et la contrôlabilité de noeuds sélectionnés (28). Pour cette addition, on commence par calculer la contrôlabilité, l'observabilité et la probabilité de détection des défaillances à chacun des noeuds. Une défaillance est ensuite sélectionnée. Si pour cette défaillance la contrôlabilité ou l'observabilité ne se trouve pas dans une gamme de valeurs prescrites et que la probabilité de détection des défaillances est inférieure à une valeur prescrite, on peut ajouter un point de contrôle (36) ou un point d'observation (34).

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