Particle characterisation apparatus

Details Particle characterisation apparatus Particle characterisation apparatus

G - Physics

01

N

G01N 15/12 (2006.01)

Patent

CA 2381285

Particle characterization apparatus working on the Coulter principle is provided with a count wafer formed by micro-machining of silicon so that the count wafer can economically be incorporated in a disposable housing (10) adapted to contain and retain for disposal liquid pumped through the count wafer during particle characterization operations. The housing may incorporate electrodes (38) (40) in each of two chambers (22, 24) separated by a wall (20) containing an orifice (36) formed in the count wafer.

L'invention concerne un appareil de caractérisation de particules fonctionnant selon le principe de Coulter. Cet appareil est pourvu d'une plaquette de comptage formée par micro-usinage d'une tranche de silicium. Cette plaquette peut être incorporée, de manière économique, dans un boîtier jetable (10) adapté pour contenir et retenir le liquide pompé à travers la plaquette de comptage lors des opérations de caractérisation des particules. Ce boîtier peut comprendre des électrodes (38)(4) dans chacune des deux chambres (22)(24). Ces dernières sont séparées par une paroi (20) dans laquelle est ménagé un orifice (36) formé dans la plaquette de comptage.

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