G - Physics – 01 – M
Patent
G - Physics
01
M
G01M 11/00 (2006.01) A61F 9/01 (2006.01)
Patent
CA 2597418
A method for assessing a performance of an ablation laser system includes ablating a substrate surface to achieve a predetermined ablation pattern. A beam of light is directed across the ablated substrate, and reflected light is received to detect an actual ablated pattern, which is compared with the predetermined ablated pattern. The resulting comparison is displayed to a user so that the performance of the laser system can be assessed. A system includes a support that is adapted to hold an ablation substrate at a treatment plane. An optical scanner directs a beam of light across the ablated substrate and receives light reflected therefrom to detect an ablated pattern. An analyzer compares the detected with a predetermined ablated pattern. A display in signal communication with the analyzer displays a comparison of the detected and the predetermined ablated pattern.
Campin John A.
Liedel Kevin K.
Pettit George H.
Alcon Refractivehorizons Inc.
Kirby Eades Gale Baker
LandOfFree
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