H - Electricity – 03 – K
Patent
H - Electricity
03
K
H03K 17/56 (2006.01) G06F 13/00 (2006.01) H03K 17/76 (2006.01)
Patent
CA 2455276
Improvements to the physical layer are provided, for example a test circuit that does not introduce further skew into critical clock signals. A boundary scan test circuit is also provided used to isolate an integrated circuit for applying test vectors or circuit brand connections to test the integrity thereof. A bias voltage generator for a voltage controlled delay line (VCDL) is also provided.
Alexeyev Alexander
Reynolds David
Richard Maurice
Waldstein Steven M.
Idt Canada Inc.
Smart & Biggar
Tundra Semiconductor Corporation
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