G - Physics – 01 – N
Patent
G - Physics
01
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G01N 21/00 (2006.01) G01B 11/06 (2006.01) G01B 17/02 (2006.01) G01N 21/17 (2006.01) G01N 29/07 (2006.01) G01N 29/12 (2006.01) G01N 29/22 (2006.01) G01N 29/24 (2006.01) G01N 29/42 (2006.01) G01N 29/46 (2006.01) G01N 29/50 (2006.01)
Patent
CA 2272956
A method and system (22) are provided to measure a physical parameter of a film (30) such as film thickness or build, in both the wet and dry states of the film, on an article in a production environment without any contact or damage to the film or the rest of the article. The system includes two laser light sources (24, 26), one pulsed (26) and the other substantially continuous (24), an interferometer (28), fiber optic cables, and appropriate optics (100).
Procédé et système (22) permettant de mesurer un paramètre physique d'un film (30), telle que l'épaisseur ou la structure, à l'état mouillé comme à l'état sec, ledit film étant placé sur un article dans un environnement de production, sans qu'il y ait contact avec le film ou le reste de l'article, ou sans que ledit film ou le reste de l'article subissent des dommages. Ledit système comporte deux sources (24, 26) de lumière laser, l'une étant pulsée (26) et l'autre sensiblement continue (24), un interféromètre (28), des câbles à fibres optiques et un dispositif optique approprié (100).
Dixon John W.
Laplant Frederick P.
White Jeffrey S.
Autospect Inc.
Macrae & Co.
Perceptron Inc.
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