Plasma mass filter

Details Plasma mass filter Plasma mass filter

H - Electricity

05

H

H05H 1/00 (2006.01) H01J 49/26 (2006.01) H01J 49/46 (2006.01)

Patent

CA 2313756

A method for separating charged particles according to their mass requires providing a multi-species plasma in a chamber The plasma includes both relatively low-mass charged particles (M1) and relatively high-mass charged particles (M2) which are influenced by crossed electric and magnetic fields (E × B) in the chamber. Specifically, the crossed fields (E × B) rotate the particles M1 and M2 in respective orbits that are characteristic of the mass of the particular particle. Inside the chamber, each charged particle has a respective cyclotron frequency (.OMEGA.), and the plasma is maintained with a density wherein the collisional frequency (v) of particles in the chamber relates to the cyclotron frequency such that their ratio is greater than approximately one (.OMEGA./v >=1). Additionally, a collector is positioned to intercept the particles (M2) in their orbits and to thereby separate the particles (M2) from the particles (M1).

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