C - Chemistry – Metallurgy – 40 – B
Patent
C - Chemistry, Metallurgy
40
B
C40B 20/04 (2006.01) C40B 40/00 (2006.01) G01N 15/00 (2006.01)
Patent
CA 2639461
The present invention provides a plurality of samples, each of which includes particles of a predetermined particle dimension, within narrow predetermined limits, dispersed in a carrier at a predetermined particle concentration. The predetermined particle dimension and the predetermined particle concentration are the same for each sample. However, advantageously, each sample has a different predetermined ratio of a value of an optical property of the particles to a value of the same optical property of the carrier. The present invention also provides a method for selecting a target sample from the plurality of samples to assess the measurement accuracy or the detection sensitivity of an optical particle analyzer as the predetermined ratio approaches 1.
Oma Peter
Sharma Deepak Kumar
Brightwell Technologies Inc.
Teitelbaum & Maclean
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