G - Physics – 01 – N
Patent
G - Physics
01
N
349/35
G01N 29/00 (2006.01) A61B 8/08 (2006.01) A61B 10/00 (2006.01) G01N 29/11 (2006.01) G01S 7/52 (2006.01) G10K 11/35 (2006.01)
Patent
CA 1165856
PHA. 21.071 18 ABSTRACT Method and apparatus for measuring an attenua- tion characteristics in a region of interest using ultra- sound. The method comprises: introducing pulses of ultrasound energy into the region and detecting narrow- band signals which represent the amplitude of echoes of the pulses which are reflected from different depths along a plurality of propagation paths within the region. The method then consists of accumulating a first statistically independent set of the signals which represent echoes from a first surface (DT1) in the region; accumulating a second statistically independent set of the signals which represent echoes from a second surface (DT2) in the region which is spaced at a determined distance (d), along the paths, from the first surface; and calculating an attenua- tion characteristic in the region as the difference between (1) a central tendency parameter, preferably the statistical means, of the logarithms of the signals in the first set and (2) the same central tendency parameters of the logarithms at the signals in the second set.
403897
Maklad Nabil F.
Ophir Jonathan
North American Philips Corporation
Van Steinburg C.e.
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