G - Physics – 01 – L
Patent
G - Physics
01
L
73/70
G01L 9/04 (2006.01) G01L 9/00 (2006.01)
Patent
CA 1309879
ABSTRACT A pressure transducer utilizes a diaphragm made, for example, of ceramic or the like having upper and lower surfaces. One surface of the diaphragm receives an elongated thick film resistor exposed to a pressure to be measured to increase the output of the transducer. The thick film resistor is oriented radially at the center of the diaphragm and is elongated in a longitudinal direction, and has known resistivity coefficients for strains in the longitudinal, transverse and normal directions with respect to the thick film resistor. Circuitry is connected to the resistor for measuring any changes in resistance due to strains or forces applied to the resistor. Pressures applied perpendicularly to the longitudinal direction of elongation of the resistor produce high outputs in the form of changes in resistance which can be used to calculate strains in the longitudinal and transverse directions as well.
576228
Skuratovsky Eugene
Sturdevant Michael L.
Babcock & Wilcox Tracy Power Inc.
Elsag International B.v.
Ridout & Maybee Llp
Skuratovsky Eugene
Sturdevant Michael L.
LandOfFree
Pressure transducer using thick film resistor does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Pressure transducer using thick film resistor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Pressure transducer using thick film resistor will most certainly appreciate the feedback.
Profile ID: LFCA-PAI-O-1189537