Probe for a coordinate measuring machine

Details Probe for a coordinate measuring machine Probe for a coordinate measuring machine

G - Physics

01

B

33/112, 33/49

G01B 9/02 (2006.01) G01B 11/00 (2006.01)

Patent

CA 1051193

PROBE FOR A COORDINATE MEASURING MACHINE ABSTRACT OF THE DISCLOSURE A probe assembly is disclosed carrying a grid grating and an index grating adapted to generate a Moire pattern upon relative movement in either or both of two orthogonal directions in a common plane. The index and grid gratings are supported for precise orthogonal motion with respect to each other by means of a pair of grating support assemblies mounted so that the correct index and grid grating spacing and orientation are precisely maintained, including a cross-slide assembly provided to allow movement in a plane while maintaining the proper orientation between the grating assemblies. A probe tip assembly is supported for friction-free parallel move- ment by a ball bearing and thrust plate arrangement and is coupled to one of the grating support assemblies by a ball and groove connection to prevent the transmission of any axial loads to the transducer and also of any substantial torque loads tending to misalign the gratings.

253470

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