Probe for composite analyzer tester

Details Probe for composite analyzer tester Probe for composite analyzer tester

G - Physics

01

N

349/35, 324/74.2

G01N 29/04 (2006.01) G01N 27/02 (2006.01) G01N 27/82 (2006.01)

Patent

CA 1270303

ABSTRACT OF THE DISCLOSURE A composite analyzer probe, for use with a composite analyzer tester instrument for non- destructively testing and analyzing the physical properties and gaging the thickness of a test material. A cylindrical probe housing has a generally flat end surface designed to be placed flat against the surface of the test material. An annular magnetic induction coil is positioned against the end surface, a piezoelectric element having a hollow cylindrical casing positioned within the annular magnetic induction coil, and an eddy current coil is positioned within the piezolelectric cylindrical casing. The single improved probe allows four different measurments to be taken at one location on the test material without any required movement or replacement of the probe.

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