Probe for measuring the thickness of frost accretion on a...

G - Physics – 01 – B

Patent

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G01B 11/06 (2006.01) B64D 15/20 (2006.01)

Patent

CA 2600014

The invention relates to a probe for measuring the thickness of frost accretion on a surface. According to the invention, the probe comprises a plurality of measuring stages (E1 to En) which are stacked at least substantially orthogonally to the base (2) of the probe and each measuring stage comprises at least one emitter which can emit a light beam that is at least substantially parallel to said base and at least one receiver which can receive said light beam after reflection on the frost.

Sonde pour la mesure de l'épaisseur d'une accrétion de givre sur une surface. Selon l'invention, cette sonde comporte une pluralité d'étages de me sure (E1 à En) superposés au moins sensiblement orthogonalement à la base (2) de ladite sonde et chaque étage de mesure comporte au moins un émetteur apte à émettre un faisceau lumineux au moins sensiblement parallèle à ladite base et au moins un récepteur apte à recevoir le dit faisceau lumineux après réflexion sur le givre.

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