G - Physics – 01 – N
Patent
G - Physics
01
N
73/53, 33/63
G01N 21/63 (2006.01) G01B 11/06 (2006.01) G01N 21/17 (2006.01) G01N 25/72 (2006.01)
Patent
CA 1164242
ABSTRACT OF THE DISCLOSURE The invention relates to a method for examining in materials such as metals in the solid state for surface defects, surface cracks or the like the properties of coating or the sur- face quality of paper. A special application of the method is the measurement of the thickness of the surface hardening layer of steel. With a view to preventing the rapid evening out of the temperature differences produced on the surface of the ma- terial under examination, a pulsed light beam in the visible light wavelength range is directed onto the material, whereby at least part of said light beam is absorbed on the surface of the material under examination and causes elevation of the sur- face temperature of the material under examination. The sur- face of the material under examination that has been heated by effect of the periodic temperature variation produced emits a pulsed infra-red radiation which is received by a sensor sensitive to infra-red radiation.
379400
Leino Jorma
Luukkala Mauri
Luukkala Mauri
Marks & Clerk
Valmet Oy
LandOfFree
Procedure for examining the surface quality of materials in... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Procedure for examining the surface quality of materials in..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Procedure for examining the surface quality of materials in... will most certainly appreciate the feedback.
Profile ID: LFCA-PAI-O-1067811