G - Physics – 01 – B
Patent
G - Physics
01
B
358/12, 358/6
G01B 15/02 (2006.01) G01N 23/20 (2006.01) G01N 23/223 (2006.01)
Patent
CA 1154883
ABSTRACT OF THE DISCLOSURE A method of measuring the quantities of material in a first coating layer applied to cardboard or an equivalent base material as well as in a second coating layer applied to said first coating layer, comprises the steps of directing a primary X-ray radiation against the second coating layer so as to excite a characteristic fluorescence radiation in the first coating layer and measuring the intensity of said fluorescence radiation be means of a detector placed above said second coating layer, whereby the measurement of the quantity of material in the second coating layer is based on the absorption of the primary X-ray radiation and the fluorescence radiation while traveling through the second coating layer. The measurements in connec- tion with the process of coating are carried out by measuring the quantity of material in the first coating layer before apply- ing the second coating layer by irradiating the first coating layer with a primary X-ray radiation so as to excite a charac- teristic fluorescence radiation in the first coating layer it- self and by measuring the intensity of this fluorescence radia- tion with a detector. The quantity of material in the second coating layer is measured after the application of this layer to the first coating layer by utilizing the value of the inten- sity of the fluorescence radiation from the first coating layer as measured before the application of said second coating layer.
419046
Puumalainen Pertti
Rantanen Rauno
Venalainen Heikki
Enso-Gutzeit Osakeyhtio
Marks & Clerk
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