Process and apparatus for measuring surface distributions of...

Details Process and apparatus for measuring surface distributions of... Process and apparatus for measuring surface distributions of...

H - Electricity

01

J

358/34

H01J 47/06 (2006.01) G01T 1/29 (2006.01)

Patent

CA 1265628

Abstract A process for precision measurement of charged particle emissions from a surface and an apparatus for providing a high resolution digital image of the distribution of such emissions in a minimum exposure time over a relatively large surface area. The process of measurement uses the direction of emissions as determined by two or more position measuring elements of an area detector. The apparatus is based on multiple region detector elements that employ proportional amplification of ionization in a gas.

532241

Affiliated with

Also associated with

Rating

Process and apparatus for measuring surface distributions of... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Process and apparatus for measuring surface distributions of..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Process and apparatus for measuring surface distributions of... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFCA-PAI-O-1221693