Process and arrangement for optoelectronic measuring of objects

Details Process and arrangement for optoelectronic measuring of objects Process and arrangement for optoelectronic measuring of objects

G - Physics

01

B

G01B 11/24 (2006.01) G01B 11/245 (2006.01)

Patent

CA 2070822

2070822 9108439 PCTABS00005 An arrangement for optoelectronic measurement of the shape of objects (4) comprises at least two light sources (5) each of which projects at least one narrow light beam (6) onto the object to be measured (light-section procedure). The narrow light beams (6) are recorded by a number of video cameras (7) equal to the number of light sources (5). The video cameras (7) are connected to an evaluation device (9) which comprises a computer and which evaluates the photos or calculates the dimensions of the object (4). Each light source (5) is associated with an individual camera (7) which responds only to the light from that light source. Each light source (5) generates a narrow light beam (6) by emitting light rays of different wavelengths and/or polarizations, or the times at which the light strikes the object (4) and the times at which the individual cameras (7) are free to record the corresponding narrow light beam (6) are synchronized and the imaging and recording times of the individual pairs of light sources and cameras (5, 7) do not overlap.

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