G - Physics – 01 – D
Patent
G - Physics
01
D
G01D 1/16 (2006.01) G01D 3/024 (2006.01) G01R 15/24 (2006.01) G01R 19/00 (2006.01)
Patent
CA 2238971
In order to measure a measured value (I) in a predetermined measurement range (MR), a first measurement signal (M1), which is an unequivocal function of the measured quantity (I) in the measurement range (MR), and a second measurement signal (M2), which is a periodic and equivocal function of the measurement value (I) in the predetermined measurement range (I), are generated. A third unequivocal measurement signal (M3) in the measurement range (MR) which has at least the measurement resolution of the second measurement signal (M2) is derived from the two measurement signals (M1, M2).
Afin de mesurer une grandeur (I) dans une plage prédéterminée de mesure (MR), on génère un premier signal de mesure (M¿1?) qui dans la plage de mesure (MR) est une fonction univoque de la grandeur mesurée (I) et un deuxième signal de mesure (M¿2?) qui dans la plage prédéterminée de mesure (MR) est une fonction périodique et non univoque de la grandeur mesurée (I). Un troisième signal de mesure (M¿3?) univoque dans la plage de mesure (MR) est dérivé des deux signaux de mesure (M¿1?, M¿2?). Le troisième signal de mesure (M¿3?) a au moins la résolution de mesure du deuxième signal de mesure (M¿2?).
Beierl Ottmar
Bosselmann Thomas
Aktiengesellschaft Siemens
Fetherstonhaugh & Co.
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