Process and device for measuring distances on bright metal...

G - Physics – 01 – B

Patent

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G01B 11/14 (2006.01) C23C 2/20 (2006.01) G01B 11/25 (2006.01) G01B 11/30 (2006.01) G01B 11/06 (2006.01)

Patent

CA 2426188

Process for measuring distances by optical means on a specular or quasi-specular strip (1) of bright metal, characterised by the following steps: - an incident light beam is emitted by a source (7) incorporated into a measurement head (10), said source projecting a pattern (11) in the form of a plurality of points, preferably a line, arranged along an axis that is essentially perpendicular to the motion direction of the metal surface, in an incidence direction upon a fixed part (5), preferably non-specular, of the installation; - firstly, said beam is partially reflected by said fixed part (5) essentially along the same path as the incident beam and in the opposite direction towards a detector (8) belonging to said measurement head (10) and located in the immediate vicinity of said source (7); - secondly, said beam is partially reflected towards said metal strip (1), from where it is further reflected in the direction of said detector (8).

Procédé pour la mesure de distances par voie optique sur une bande de métal brillant (1), spéculaire ou quasi-spéculaire, caractérisé par les étapes suivantes : -un faisceau lumineux incident est émis par une source (7) incorporée dans une tête de mesure (10), ladite source projetant un motif (11) sous forme d'une pluralité de points, de préférence une ligne, disposés selon un axe essentiellement perpendiculaire ô la direction de défilement de la surface métallique, selon une direction d'incidence sur une partie fixe (5), de préférence non spéculaire, de l'installation; - premièrement, ledit faisceau est partiellement réfléchi par ladite partie fixe (5), essentiellement selon la même direction que celle du faisceau incident et en sens opposé, vers un déctecteur (8) appartenant ô ladite tête de mesure (10) et se trouvant ô proximité immédiate de ladite source (7); deuxièmement, ledit faisceau est partiellement réfléchi vers ladite bande métallique (1), d'où il est encore réfléchi en direction dudit détecteur (8).

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