G - Physics – 01 – R
Patent
G - Physics
01
R
324/57
G01R 33/032 (2006.01)
Patent
CA 1233515
-19- ABSTRACT OF THE DISCLOSURE PROCESS FOR THE MAGNTOOPTICAL MEASUREMENT OF MAGNETIC FIELDS, MEASURING SYSTEM AND MEASURING CELL USING SUCH A PROCESS The invention relates to a process for measuring a magnetic field based on the Faraday effect rotation of a light beam passing through a ferrimagnetic coating subject to a magnetic field to be measured. According to the invention, the magnetization direction within the ferrimagnetic coating is coherently oriented by applying a high amplitude alternating magnetic field oriented in accordance with the axis of the light beam. This is followed by a progressive reduction of the amplitude of this magnetic field and the magnetic field to be measured is compensated. The invention also supplies a system and a measuring cell making it possible to perform said process. The invention can be used in magnetometers.
472640
Doriath Gerard
Hartemann Pierre
Jacobelli Alain
Goudreau Gage Dubuc
Thomson-Csf
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