Process for the selective analysis of individual trace-like...

Details Process for the selective analysis of individual trace-like... Process for the selective analysis of individual trace-like...

G - Physics

01

N

358/9

G01N 30/72 (2006.01) G01N 33/48 (2006.01) H01J 49/10 (2006.01)

Patent

CA 1195013

A process for the selective analysis of individual trace-like components in gases and liquids ABSTRACT OF THE DISCLOSURE The analysis comprises first enriching the component to be determined (target component) by contacting an non porous solid surface with the gas or the liquid to be investigated and depositing the target component from the gaseous or liquid phase onto the solid sur- face in the range of a monolayer preferably within the first monolayer. The deposition is effected by absorbing the target component either directly or in the form of a derivative product, which can then be detected by introducing the solid surface with the enriched target component into a mass spectrometer. Surface sensitive mass analysers, such as secondary ion mass spectrometers or laser activated mass ana- lysers,have been proven successful.

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