Process measurement and control

G - Physics – 05 – B

Patent

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341/114, 23/220

G05B 11/40 (2006.01) G06G 7/186 (2006.01) G06G 7/58 (2006.01)

Patent

CA 1098197

Abstract of the Disclosure In the measurement of a variable process parameter and control of the process in response thereto, a transform of a process parameter measure- ment signal that can be described as the time derivative of a second order or higher lagged process parameter measurement signal is utilized to provide predictive capability. This transform is combined with the output of a PI controller to the input of which the process parameter measurement signal has been fed, thereby generating a process variable signal that is either direct- ly or after passing through another controller is utilized as a process control signal for controlling the process in response to the measured parameter. The system is particularly well adapted to control of a non- self-regulating process.

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