Processing system for detection and the classification of...

G - Physics – 01 – N

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G01N 21/39 (2006.01) G01N 21/89 (2006.01)

Patent

CA 1133063

47,995 -19- ABSTRACT OF THE DISCLOSURE This invention is a system of automatically clas- sifying defects both for sorting defective products (metal- lic surfaces, especially tube surfaces) as to the reworking operation required for correcting the defect, and for clas- sifying the defect as to the preceding manufacturing opera- tion which is the most probable cause of that defect and sending a signal to that operation to provide for adjust- ments to minimize future defects. The system uses a source of electromagnetic radiation (typically a laser beam which is scanned across the surface) and at least two sensors (adjusted such that the radiation is reflected from a defect- free surface principally received by one of the sensors but that there is a measured amount of radiation in the other sensor). An average signal of the principal sensor is developed as a function of scan position. Threshold cir- cuitry detects when the ratio of sensor signal to average signal varies by a predetermined amount. Special circuitry is used to detect the essentially simultaneous occurrence of at least two different preselected combinations of signal variations to identify the type of defect.

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