G - Physics – 06 – F
Patent
G - Physics
06
F
354/225.1
G06F 11/22 (2006.01) G01R 31/317 (2006.01) G01R 31/319 (2006.01) G06F 11/28 (2006.01) H04L 1/12 (2006.01) H04L 1/24 (2006.01)
Patent
CA 1158776
ABSTRACT PROGRAMMABLE SEQUENCE GENERATOR FOR IN-CIRCUIT DIGITAL TESTING A circuit for use in an in-circuit digital tester (1) for generating data bus and control line test signals to test the electrical performance properties of components in a device under test (26) is disclosed. Certain compo- nents in a device under test, such as a microprocessor, are bus oriented devices which perform their functions in predetermined cycles. These cycles have been divided up into control signals and data bus signals. Each sequence of control signals is referred to as a protocol sequence. Each test pin in a bed of nails test fixture (24) has a digital test signal generator (18,22) associated therewith. The present invention operates to program each test signal generator with digital test signal generating data to pro- duce the protocol sequences. Test cycles are run in which a predetermined sequence of the protocol sequences are generated to test the components. This predetermined sequence in protocol sequences is specified by a sequence in starting addresses of the various protocol sequences programmed into the generators.
378527
Meredith & Finlayson
Zehntel Inc.
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