G - Physics – 01 – B
Patent
G - Physics
01
B
G01B 5/20 (2006.01) G01B 21/30 (2006.01)
Patent
CA 2059939
RD-20,352 QUALITY ASSURANCE OF SURFACE TREATMENTS BY ANALYSIS OF SUBSTRATE SURFACE LINE TRACES Abstract of the Invention A quality assurance of surface treatments, typically with shot peening, by analysis of substrate surface line traces is disclosed. In particular, line traces are created over the surface treated substrate. These line traces are filtered with a low pass filter to create relative maximums. The coordinates of the relative maximums are determined and the spatial distance between these coordinates are measured and recorded. The actual plastic upset depth of the surface treatment substrate is determined. The surface treatment is then adjusted, if necessary, based upon the values of these spatial distances and actual plastic upset depths..
Markell Trent J.
Thompson Robert A.
Company General Electric
Craig Wilson And Company
Markell Trent J.
Thompson Robert A.
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