G - Physics – 01 – N
Patent
G - Physics
01
N
G01N 33/52 (2006.01) G01N 21/25 (2006.01) G01N 31/00 (2006.01) G01N 33/48 (2006.01) G01N 33/72 (2006.01) G01N 37/00 (2006.01)
Patent
CA 2402537
The present invention provides a method of monitoring calibration of a spectrophotometric apparatus that comprises one or more calibration algorithms for one or more analytes. This method comprises measuring absorbance of a quality control material with the apparatus to obtain a measurement, where the quality control material exhibits an absorbance spectrum characterized as having a negative slope for a continuous spectral segment from about 5 nm to about 200 nm in length, and where the spectral segment includes a principal calibration wavelength for the one or more analytes. The method then involves calculating one or more concentration values from the measurement using the one or more calibration algorithms, followed by comparing the one or more concentration values with an assigned value given to the quality control material for each of the one or more analytes. In this way one or more calibration algorithms of the apparatus may be monitored. The present invention includes a quality control material for mimicking two or more analytes comprising, one or more substances having a combined absorption spectrum exhibiting a negative slope for a continuous spectral segment of from about 5 nm to 200 nm in length, in a portion of an absorption spectrum, including one or more principal calibration wavelengths, for the two or more analytes.
Gowling Lafleur Henderson Llp
Niresults Inc.
Samsoondar James
LandOfFree
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