G - Physics – 02 – B
Patent
G - Physics
02
B
G02B 21/16 (2006.01) G01N 21/64 (2006.01) G02B 21/34 (2006.01)
Patent
CA 2399627
The present invention relates to calibration apparatuses, methods or tools used in microscopy. A calibration tool for fluorescent microscopy includes a support, a solid surface layer including a fluorescent material, and a thin opaque mask of non-fluorescent material defining reference feature openings having selected dimensions exposing portions of the surface layer. A first type of the calibration tool may include an adhesion promoter facilitating contact between the surface of the support and the solid surface layer including the fluorescent material, which is in contact with the thin opaque mask. A second type of the calibration tool may include the thin opaque mask fabricated (with or without an adhesion promoter) onto the support, and the solid surface layer including the fluorescent material located on the thin opaque mask.
La présente invention concerne des appareils d'étalonnage, des procédés et des outils utilisables en microscopie. Un outil d'étalonnage pour la microscopie par fluorescence comporte un support, une couche de surface solide comprenant un matériau fluorescent, et un masque mince et opaque de matériau non fluorescent définissant des orifices de caractéristiques de référence présentant des dimensions révélant des portions de la couche de surface. Un premier type d'outil d'étalonnage peut comprendre un promoteur d'adhérence facilitant le contact entre la surface du support et le masque opaque mince. Un deuxième type d'outil d'étalonnage peut comporter le masque opaque mince (avec ou sans promoteur d'adhérence) réalisé sur le support, et la couche de surface solide comprenant le matériau fluorescent située sur le masque opaque mince.
Affymetrix Inc.
Smart & Biggar
LandOfFree
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