Quantitative analysis of surface-derived samples using mass...

G - Physics – 01 – N

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G01N 33/68 (2006.01)

Patent

CA 2651227

A substrate incorporating an internal standard facilitates quantitating analytes in a sample by surface-interrogating mass spectrometry techniques without wet chemistry sample preparation. The user disposes a sample to be analyzed onto the surface of the pretreated substrate. Then the sample-bearing solid substrate, which incorporates an internal standard for each analyte to be quantitated, is ready for interrogation.

L'invention concerne un substrat incorporant un étalon interne qui facilite la quantification d'analytes dans un échantillon par des techniques d'interrogation de surface par spectrométrie de masse sans préparation de l'échantillon par une chimie par voie humide. L'utilisateur dispose d'un échantillon à analyser sur la surface du substrat prétraité. Le substrat solide portant l'échantillon, qui incorpore un étalon interne pour chaque analyte à quantifier, est alors prêt à être interrogé.

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