Quantum well intermixing

H - Electricity – 01 – S

Patent

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Details

H01S 5/026 (2006.01) H01L 21/18 (2006.01) H01L 21/266 (2006.01) G02B 6/12 (2006.01) H01S 5/20 (2006.01) H01S 5/34 (2006.01)

Patent

CA 2398301

In a method of manufacturing a photonic integrated circuit having a compound semiconductor structure having a quantum well region, the structure is irradiated using a source of photons to generate defects, the photons having energy (E) at least that of the displacement energy (ED) of at least one element of the compound semiconductor. The structure is subsequently annealed to promote quantum well intermixing. The preferred radiation source is a plasma generated using an electron cyclotron resonance (ECR) system. The structure can be masked in a differential manner to selectively intermix the structure in a spatially controlled manner by controlling the exposure portions of the structure to the source of radiation.

La présente invention concerne un procédé de fabrication d'un circuit intégré photonique à structure de semi-conducteur composé pourvue d'une région en puits quantique. En l'occurrence, la structure est éclairée depuis la source de photons de façon à produire des défauts, l'énergie des photons (E) étant au moins celle de l'énergie de déplacement (E¿D?) de l'un au moins des éléments du semi-conducteur composé. La structure subit ensuite un recuit de façon à favoriser le mélange des puits quantiques. La source de rayonnement préférée est un plasma obtenu par chauffage électronique cyclonique (ECR). La structure peut être masquée en mode différentiel de façon à mélanger sélectivement la structure d'une façon spatialement contrôlée par une gestion des zones de la structure exposées à la source de rayonnement.

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