H - Electricity – 03 – K
Patent
H - Electricity
03
K
328/81
H03K 5/00 (2006.01) G11C 8/08 (2006.01) G11C 11/413 (2006.01)
Patent
CA 1177910
ABSTRACT A discharge circuit for rapidly discharging the word lines of random access memories to thereby prevent erroneous reading from or writing into the memory during periods when the word lines are in a mid-state transition between selected and deselected voltage levels. Each discharge circuit associated with the memory word lines includes a transistor that is conductive only when a full select voltage level is applied to the word line and which controls conduction of a second multi-collector transistor coupled between top and bottom lines of a word line pair and a current source to discharge the word line pair during the mid-state transition period and to thus increase the speed capabilities of the memory.
407086
Fairchild Semiconductor Corporation
Smart & Biggar
LandOfFree
Random access memory dual word line recovery circuitry does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Random access memory dual word line recovery circuitry, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Random access memory dual word line recovery circuitry will most certainly appreciate the feedback.
Profile ID: LFCA-PAI-O-1206579