Reagent gas control for an ion trap mass spectrometer used...

G - Physics – 05 – D

Patent

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Details

G05D 7/00 (2006.01) H01J 49/04 (2006.01) H01J 49/38 (2006.01) G01N 30/72 (2006.01)

Patent

CA 2090357

A reagent gas flaw control system for use with an ion trap mass spectrometer is shown. The gas reagent gas flows from a source through a first gas flow restrictor connected to the inputs of second and third gas flow restrictors. The output of the second restrictor is connected to the ion trap where reagent gas is used, and the output of the third restrictor is connected to a vacuum pump, which may be the roughing pump used by the ion trap. At least one of the three restrictors is a variable restrictor. The configuration of the present invention allows the use of simple and inexpensive parts to provide exacting flow control.

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