Rectilinear ion trap and mass analyzer system and method

H - Electricity – 01 – J

Patent

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H01J 49/42 (2006.01)

Patent

CA 2513067

A new geometry ion trap and its use as a mass spectrometer is described. The ion traps can be combined linearly and in parallel to form systems for mass storage, analysis, fragmentation, separation, etc. of ions. The ion trap has a simple rectilinear geometry with a high trapping capacity. It can be operated to provide mass analysis in the mass-selective instability mode as well as the mass-selective stability mode. Arrays of multiple ion traps allow combinations of multiple gas-phase processes to be applied to the trapped ions to achieve high sensitivity, high selectivity and/or higher throughput in the analysis of ions.

L'invention concerne un piège ionique de géométrie nouvelle et l'utilisation de celui-ci en tant que spectromètre de masse. Selon l'invention, les pièges ioniques peuvent être combinés linéairement et parallèlement afin de former des systèmes de stockage, d'analyse, de fragmentation, de séparation etc. de la masse d'ions. Le piège ionique selon l'invention présente une géométrie rectiligne simple et une capacité de piégeage élevée. Ledit piège ionique peut effectuer une analyse de masse dans le mode instable sélectif en masse ainsi que dans le mode stable sélectif en masse. Des réseaux de plusieurs pièges ioniques permettent d'appliquer des combinaisons de plusieurs processus en phase gazeuse aux ions piégés afin d'améliorer la sensibilité, la sélectivité et/ou le débit de l'analyse ionique.

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