Reduced dark current photodetector

H - Electricity – 01 – L

Patent

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Details

H01L 31/00 (2006.01)

Patent

CA 2646692

A photo-detector comprising: a photo absorbing layer comprising n-doped semiconductor exhibiting valence band energy level; a barrier layer, a first side of the barrier layer adjacent a first side of the photo absorbing layer, the barrier layer exhibiting a valence band energy level substantially equal to the valence band energy level of the doped semiconductor of the photo absorbing layer; and a contact area comprising doped semiconductor, the contact area being adjacent a second side of the barrier layer opposing the first side, the barrier layer exhibiting a thickness and a conductance band gap sufficient to prevent tunneling of majority carriers from the photo absorbing layer to the contact area and block the flow of thermalized majority carriers from the photo absorbing layer to the contact area. Alternatively, a p-doped semiconductor is utilized, and conductance band energy levels of the barrier and photo absorbing layers are equalized.

L'invention concerne un photodétecteur qui comprend: une couche photo-absorbante renfermant un semiconducteur dopé de type n possédant un niveau d'énergie de bande de valence; une couche barrière, un premier côté de la couche barrière étant adjacent à un premier côté de la couche photo-absorbante, la couche barrière possédant un niveau d'énergie de bande de valence sensiblement égal à celui du semiconducteur dopé de la couche photo-absorbante; et une zone de contact renfermant un semiconducteur dopé, la zone de contact étant adjacente à un second côté de la couche barrière opposé au premier côté, la couche barrière possédant une épaisseur et une largeur de bande interdite de conductance suffisante pour empêcher le passage par effet tunnel des porteurs de charge majoritaires de la couche photo-absorbante dans la zone de contact, et pour bloquer le flux des porteurs de charge majoritaires thermalisés de la couche photo-absorbante vers la zone de contact. Dans un autre mode de réalisation, on utilise un semiconducteur dopé de type p, et on égalise les niveaux d'énergie de la bande de conductance de la couche barrière et de la couche photo-absorbante.

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