G - Physics – 21 – K
Patent
G - Physics
21
K
358/5
G21K 1/06 (2006.01)
Patent
CA 1223090
ABSTRACT X-ray dispersive and reflective structures and materials are provided which exhibit improved resolution and reflectivity in specific ranges of interest without substantial fluorescence or ab- sorption edges. The structures are formed of metallic and non-metallic layer pairs and can in- clude a buffer layer between each layer to prevent interdiffusion to stabilize the structures. The materials can be thermally activated to control the desired properties, during or post deposi- tion. The structures can be deposited by ion beam absorption techniques to form the structures in a precise manner. The index of the refraction of the structures can be continuously varying throughout the structures.
455357
Flessa Steven A.
Hart Keith L.
Keem John E.
Ovshinsky Stanford R.
Sztaba Lennard
Macrae & Co.
Ovonic Synthetic Materials Company Inc.
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