G - Physics – 01 – N
Patent
G - Physics
01
N
73/55
G01N 21/47 (2006.01) G01J 3/42 (2006.01) G01J 3/28 (2006.01) G01J 3/36 (2006.01)
Patent
CA 1319531
ABSTRACT OF THE DISCLOSURE A spectrophotometer (10) is provided having the capability to accurately measure spectral reflectance at relatively long sample distances. A first illumination optics arrangement (14) assures uniform illumination to a portion of the sample and a second optical arrangement (20) focuses the reflected image of part of the illuminated sample onto a polychromator (22). Reference beam means are provided so that the polychromator sequentially measures the spectral characteristics of the reference beam and the sample. Continuous monitoring of the illumination at select wavelengths provides illumination normalization data so that a microprocessor (40) can normalize the illumination and compare the reference beam and sample measurements to accurately determine the spectral reflectance characteristics of the sample. Angular and raster scanning capability is also provided.
538433
Van Aken Harold
Weber William L.
Gretagmacbeth L.l.c.
Ogilvy Renault Llp/s.e.n.c.r.l.,s.r.l.
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